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Home › Method and apparatus for measuring axially extending defects in ferromagnetic elements

Method and apparatus for measuring axially extending defects in ferromagnetic elements

US Patent 4792756 · Granted Dec 20, 1988

Estimated economic value: $13,146,000 ⓘ

Assignee

Pa

Inventors

Clive Lam (25 patents)
Marvin Milewits (12 patents)
James E. Bradfield (7 patents)

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