Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Process for the continuous, contact-free measurement of layer thicknesses and apparatus for performing the process

Process for the continuous, contact-free measurement of layer thicknesses and apparatus for performing the process

US Patent 4780680 · Granted Oct 25, 1988

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Stator of an electrical machine, comprising an arrangement for temperature detec2022
Torque transmission arrangement, and drive module comprising same2019
Actuating device for a friction clutch device and torque transmission device for2013
Process for removing methanol from formaldehyde-containing solutions2007
Clutch release mechanism with a device for compensating for lack of precision in2006
Master cylinder2005
Hydraulic actuation device in motor vehicles2005
Radiation-curable mixture, and radiation-sensitive recording material produced t1997
Power recovery plant1996
Positive radiation-sensitive mixture and recording material produced therefrom1995
Cleaning composite for optical and magneto-optical storage disks1994
Apparatus for reprocessing special waste1994