Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method for testing contact interruptions of circuit interconnection devices

Apparatus and method for testing contact interruptions of circuit interconnection devices

US Patent 4751721 · Granted Jun 14, 1988

Estimated economic value: $88,864,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System and method for communicating a timing signal between backplanes2010
Redundant clock source2008
Systems and methods for clock generation using hot-swappable oscillators2007
Method for the detection of an incorrect oscillator frequency and clock generati2006
Short circuit protection module2002
Load insensitive clock source to enable hot swap of a node in a multiprocessor c2002
Sinusoidal radio-frequency clock distribution system for synchronization of a co2001
Sinusoidal radio-frequency clock distribution system for synchronization of a co2001
Clock architecture for synchronous system bus which regulates and adjusts clock 1997
Power sequencing control1996
Power supply interlock for a distributed power system1993
Apparatus and method for testing impedances of interconnect devices1989