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Home › Method and apparatus for measuring defects in ferromagnetic elements

Method and apparatus for measuring defects in ferromagnetic elements

US Patent 4710712 · Granted Dec 1, 1987

Estimated economic value: $9,878,000 ⓘ

Assignee

Pa

Inventors

James E. Bradfield (7 patents)
John E. Kahil (4 patents)
Mark S. Jaynes (3 patents)
Gordon L. Moake (38 patents)
Marvin Milewits (12 patents)
Curtis W. Bolton, III (1 patents)
Clive Lam (25 patents)
Roderic K. Stanley (5 patents)

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