{"@context": "https://schema.org", "@type": "BreadcrumbList", "itemListElement": [{"@type": "ListItem", "position": 1, "name": "Home", "item": "https://www.patentleaderboard.com/"}, {"@type": "ListItem", "position": 2, "name": "Method and apparatus for measuring the depth of local defects in ferromagnetic elements", "item": "https://www.patentleaderboard.com/patent/4704580"}]}

Home › Method and apparatus for measuring the depth of local defects in ferromagnetic elements

Method and apparatus for measuring the depth of local defects in ferromagnetic elements

US Patent 4704580 · Granted Nov 3, 1987

Estimated economic value: $25,466,000 ⓘ

Assignee

Pa

Inventors

Gordon L. Moake (38 patents)
James E. Bradfield (7 patents)

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