Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Optical method and apparatus for strain analysis

Optical method and apparatus for strain analysis

US Patent 4690552 · Granted Sep 1, 1987

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Non-destructive testing and imaging2008
Plurality of light sources for inspection apparatus and method2007
Tire inspection apparatus and method2005
Computer interface device1996
Method and apparatus for viewing a shearographic image1995
Method and apparatus for viewing a shearographic image1995
Shearing optical element for interferometric analysis system1994
Shearing optical element for interferometric analysis system1994
Single lens reflex camera1992
Interferometric test standard1991
Combined telephone, computer and modem1991
Keyboard1990