Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Buckling beam test probe assembly

Buckling beam test probe assembly

US Patent 4686464 · Granted Aug 11, 1987

Estimated economic value: $42,979,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Hardware firewalls with adaptive deny-by-default (DBD) access control2024
OTP control logic with randomization for sensing and writing fuse values2022
Modular multilayer interwiring structure1994
Contact probe arrangement for electrically connecting a test system to the conta1989
Contact probe arrangement for electrically connecting a test system to the conta1989