Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Rotatable and translatable mounting mechanism for a specimen pattern in optical processing apparatus

Rotatable and translatable mounting mechanism for a specimen pattern in optical processing apparatus

US Patent 4659172 · Granted Apr 21, 1987

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Inspection system including parallel imaging paths with multiple and selectable 2019
System and method for reducing dynamic range in images of patterned regions of s2017
Super resolution inspection system2015
Active planar autofocus2014
Method and apparatus for identifying defects in a substrate surface by using dit2007
Proximity effect correction method through uniform removal of fraction of interi2001
Inspection system for array of microcircuit dies having redundant circuit patter1992
Method and apparatus for detecting defect information in a holographic image pat1989
Inspection system for array of microcircuit dies having redundant circuit patter1989
Specimen distance measuring system1988