Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of and apparatus for measuring the cut-off wavelength of the first higher order mode in optical fibers

Method of and apparatus for measuring the cut-off wavelength of the first higher order mode in optical fibers

US Patent 4657388 · Granted Apr 14, 1987

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Apparatus for measuring transverse moment of an electromagnetic field associated1990
Apparatus for measuring transverse moment of an electromagnetic field associated1990
Apparatus for reducing optical-fiber attenuation1990
Method of reducing optical-fiber attenuation1990
Method of measuring polarization and birefringence in single-mode optical fibers1989
Method of and apparatus for measuring polarization beat-length in highly-birefri1988
Method of and apparatus for the measurement of mode field radius in single-mode 1988
Method of and apparatus for the measurement of mode field radius in single-mode 1988
Method and device for measuring coupling losses in single mode optical fibers1988
Method and device for measuring coupling losses in single mode optical fibers1988
Semiconductor lasers1987
Method of and apparatus for the measurement of the refractive-index profile in m1987