Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method for failure testing of a control turn-off semiconductor

Apparatus and method for failure testing of a control turn-off semiconductor

US Patent 4641231 · Granted Feb 3, 1987

Estimated economic value: $10,257,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Switched MOV device1997
Method and apparatus for achieving current balance in parallel connected switchi1994
Method and apparatus for achieving current balance in parallel connected switchi1994
Power conversion scheme employing shorting means to control current magnitude1992
Power conversion scheme employing paralleled units1991
Method and apparatus for matching turn-off times of parallel connected semicondu1991
Control system for a current source converter supplying an AC bus1991
Method and apparatus for controlling a power converter1991
Method and apparatus for determining the control electrode to cathode junction v1988
Method and apparatus for determining the control electrode to cathode junction v1988
Frequency measurement system1986
Flux control for induction motor drive using load commutated inverter circuit1986