Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Apparatus and method for individually testing combined active elements

Apparatus and method for individually testing combined active elements

US Patent 4321527 · Granted Mar 23, 1982

Estimated economic value: $4,084,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

High speed switch matrix1991
Temperature compensating method and apparatus for thermally stabilizing amplifie1984
Input optimized FET bias circuit1982
Redundant microwave switching matrix1982
Coupler having arbitrary impedance transformation ratio and arbitrary coubling r1981
Hermetically sealed active microwave integrated circuit1981
N-way series connected quadrature power divider and combiner1981