Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Eddy-current test probe with segmented circumferential test gap and method for inspection of materials

Eddy-current test probe with segmented circumferential test gap and method for inspection of materials

US Patent 4204159 · Granted May 20, 1980

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method and apparatus for measuring hydrogen concentration in zirconium alloy com2008