Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for controlling specimen analysis system and specimen analysis system

Method for controlling specimen analysis system and specimen analysis system

US Patent 12498386 · Granted Dec 16, 2025

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method of transporting rack and sample measurement system2025
Sample measurement system and method of transporting racks2024
Display device, sample measurement system, display method and program2022
Specimen smearing apparatus, specimen smearing method, smear sample preparing ap2022
Test system2022
Testing system and method of starting testing system2022
Transport device, sample measurement system, and transport method2022
Measurement system, rack export-import unit, and method of exporting and importi2021
Sample analysis system, cleaning liquid preparation apparatus, sample analyzer, 2020
Specimen smearing apparatus, specimen smearing method, smear sample preparing ap2020
Sample measurement system and method of transporting in and out rack2020
Position adjustment method for movable unit in sample analyzer, and sample analy2019