Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › High resolution multi-reflection time-of-flight mass analyser

High resolution multi-reflection time-of-flight mass analyser

US Patent 12469691 · Granted Nov 11, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Ion transport between ion optical devices at different gas pressures2025
Ion transport between ion optical devices at different gas pressures2025
Voltage supply for a mass analyser2025
Voltage supply for a mass analyser2025
Ion accumulation control for analytical instrument2025
Ion accumulation control for analytical instrument2025
Electrostatic ion trap configuration2025
Method for correcting mass spectral data2025
Method for correcting mass spectral data2025
Charge detection for ion accumulation control2025
Charge detection for ion accumulation control2025
System and method for preparation and delivery of biological samples for charged2024