Method for predicting failure of semiconductor device, and semiconductor device

Assignee

No assignee recorded.

Inventors

• Masataka Deguchi (25 patents)
• Jun Muramatsu (8 patents)
• Keita KATAOKA (9 patents)
• Katsuhiro Kutsuki (12 patents)
• Isao Aoyagi (6 patents)
• Takashi Tominaga (38 patents)
• Unknown
• Unknown

View full patent text on Google Patents →