Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Integrated circuit package for scan testing semiconductor chip, operating method of integrated circuit package, and integrated circuit

Integrated circuit package for scan testing semiconductor chip, operating method of integrated circuit package, and integrated circuit

US Patent 12411175 · Granted Sep 9, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Display device and content providing method thereof2022
Electronic apparatus and control method thereof2021
Method for estimating disparity search range to which multi-level disparity imag2017
Mobile terminal with sealing structure2015
Portable terminal2014
Signal processing apparatus and method for removing reflected wave generated by 2013
Artificial ear and method for detecting the direction of a sound source using th2013