Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Temperature measurement calibration method without interference of shutter of thermal imaging module

Temperature measurement calibration method without interference of shutter of thermal imaging module

US Patent 12385790 · Granted Aug 12, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Accurate temperature measurement structure of wide temperature range and method 2025
Accurate temperature measurement structure of wide temperature range and method 2025
Accurate temperature measurement structure of wide temperature range and method 2025
Accurate temperature measurement structure of wide temperature range and method 2025
High-precision non-contact temperature measurement device2024
High-precision non-contact temperature measurement device2024
High-accuracy contactless measurement method for measuring temperature of metal 2022
High-accuracy contactless measurement method for measuring temperature of metal 2022
Microbolometer readout circuit and calibration method using the same2021
Temperature measurement correction method, electronic system and method of gener2021
Temperature measurement correction method, electronic system and method of gener2021
Sound recognition device and sound recognition method applied therein2021