Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Protection circuit for high temperature reverse bias test

Protection circuit for high temperature reverse bias test

US Patent 12316099 · Granted May 27, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Acquisition of optical characteristics2025
Appearance capture under ambient lighting conditions using a deep-learning neura2025
Semiconductor device and manufacturing method thereof2025
Apparatus for measuring dynamic on-resistance of nitride-based semiconductor dev2024
Apparatus for measuring dynamic on-resistance of nitride-based semiconductor dev2024
Terminal protection network and electronic device2024
Terminal protection network and electronic device2024
Dielectric barrier discharge ionization, analytical instrument and ionization me2024
Nitride-based semiconductor device and method for manufacturing the same2024
Semiconductor device and manufacturing method thereof2024
Method for wafer-level adjustment of protection circuits of electronic devices a2024
Clamping circuit integrated on gallium nitride semiconductor device and related 2024