Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Two-level paralleliztion of goodness-of-fit tests for spatial process models

Two-level paralleliztion of goodness-of-fit tests for spatial process models

US Patent 12299360 · Granted May 13, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Dynamic elimination of old IPv6 addresses from WLAN/BYOD/IOT devices INDHCPv6 st2024
Elimination of old IPV6 addresses from WLAN stations in DHCPV6 stateful mode aft2023
RU (resource unit)—based medium access control for suppressing airtime of quaran2023
Managing station connectivity in microcell Wi-Fi environment on a data communica2023
Fingerprinting BYOD (bring your own device) and IOT (internet of things) IPV6 st2020
Packet capture grouping for MU-MIMO (multi-user / multiple input—multiple output2019
Dynamic application bandwidth throttling and station steering for access points 2019
Fingerprinting BYOD (bring your own device) and IOT (internet of things) IPV6 st2018