Backscatter imaging device, control method and inspection system

Assignee

• Nuctech Company Limited

Inventors

• Zhiqiang Chen (340 patents)
• Yuanjing Li (245 patents)
• Shangmin Sun (64 patents)
• Chunguang Zong (26 patents)
• Yu-Hsiang Hu (202 patents)
• Huaping Tang (34 patents)
• Bicheng Liu (20 patents)
• Weizhen Wang (22 patents)

View full patent text on Google Patents →