Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Data inspection for digital lithography for HVM using offline and inline approach

Data inspection for digital lithography for HVM using offline and inline approach

US Patent 12292693 · Granted May 6, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Shortest path computation method, routing obtaining device, and server2025
Optimization of a digital pattern file for a digital lithography device2025
Lens cap2025
Overlaying on locally dispositioned patterns by ML based dynamic digital correct2025
Automated decision platform2024
Overlaying on locally dispositioned patterns by ML based dynamic digital correct2024
Data inspection for digital lithography for HVM using offline and inline approac2024
Data inspection for digital lithography for HVM using offline and inline approac2024
Data inspection for digital lithography for HVM using offline and inline approac2024
Preserving hierarchical structure information within a design file2024
Programmable device for processing data set and method for processing data set2023
Apparatus for adding protection function for indirect access memory controller2022