Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method and measuring device for measuring objects by means of x-ray fluorescence

Method and measuring device for measuring objects by means of x-ray fluorescence

US Patent 12287302 · Granted Apr 29, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Measuring device and a method for microwave-based investigation2024
Method of measuring the AM/PM conversion of a device under test2020
Vector network analyzer and measuring method for frequency-converting measuremen2020
Measurement apparatus2020
Test device, remote measurement module and test method2019
Network analyzer systems and methods for operating a network analyzer2019
Method for measuring group delay on a device under test, measurement device as w2019
Measuring device and a method for microwave-based investigation2019
Method and apparatus for analyzing a transmission signal2019
Method, a calibration unit and a system for determining system errors and power 2019
Measurement accessory device2019
Comb signal generator, measuring device and method2019