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Home › Method of operating a storage device including detecting an abnormal area, where an access time exceeds a reference latency, as an optional area in the nonvolatile memory device and storing optional data in the optional area, and a storage device for performing the method

Method of operating a storage device including detecting an abnormal area, where an access time exceeds a reference latency, as an optional area in the nonvolatile memory device and storing optional data in the optional area, and a storage device for performing the method

US Patent 12271611 · Granted Apr 8, 2025

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