Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method to detect a defect on a lithographic sample and metrology system to perform such a method

Method to detect a defect on a lithographic sample and metrology system to perform such a method

US Patent 12271115 · Granted Apr 8, 2025

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

System for OCT image translation, ophthalmic image denoising, and neural network2025
Device and method for measuring a surface topography, and calibration method2025
Patient tuned ophthalmic imaging system with single exposure multi-type imaging,2025
Method and apparatus for generating a 3D reconstruction of an object2024
Stereoscopy method and stereoscopy apparatus2024
Accessible neural network image processing workflow2024
Optical three-dimensional scanning for collision avoidance in microscopy system2023
3D calibration body, calibration method for the spatial calibration of an optica2023
Edge phase effects removal using wavelet correction and particle classification 2023
Method and device for additive manufacturing utilizing simulation test results o2023
System, method and marker for the determination of the position of a movable obj2022
Method and devices for displaying stereoscopic images2022