Semiconductor chip and test method of the same

Assignee

• Samsung

Inventors

• Yeon Ho Jung (6 patents)
• Jong-wook Kye (6 patents)
• Min Woo Kwak (2 patents)
• Mi Joung Kim (2 patents)
• Chan Wook Park (9 patents)
• Do-Hoon Byun (5 patents)
• Kwan Seong Lee (2 patents)
• Jae Ho Lee (331 patents)
• Jae Seung Choi (53 patents)
• Hwang Ho Choi (9 patents)

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