Optical inspection method, non-transitory storage medium storing optical inspection program, processing device, and optical inspection apparatus

Assignee

• Kabushiki Kaisha Toshiba
• Toshiba Digital Solutions

Inventors

• Hiroshi Ohno (180 patents)
• Hiroya KANO (23 patents)
• Takahiro Kamikawa (20 patents)
• Hideaki Okano (53 patents)
• Akifumi Ohno (4 patents)
• Akio Kawasaki (4 patents)
• Toshihiro Kikkawa (1 patents)

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