Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Deep learning system applicable for quality inspection by learning only non-defective manufactured product data and control method thereof

Deep learning system applicable for quality inspection by learning only non-defective manufactured product data and control method thereof

US Patent 12146839 · Granted Nov 19, 2024

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Magnetic memory devices2025
Core insertion type spiral tube and making method for the same2025
Deep learning-based quality inspection system applicable to injection process an2024
Deep learning-based quality inspection system applicable to injection process an2024
Deep learning-based quality inspection system applicable to injection process an2024
Deep learning-based quality inspection system applicable to injection process an2024
AI-based product surface inspecting apparatus and method2024
AI-based product surface inspecting apparatus and method2024
AI-based product surface inspecting apparatus and method2024
Thermal image-based hybrid object detection method using YOLO model and object t2024
Thermal image-based hybrid object detection method using YOLO model and object t2024
Thermal image-based hybrid object detection method using YOLO model and object t2024