Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Vertical probe head with improved contact properties towards a device under test

Vertical probe head with improved contact properties towards a device under test

US Patent 12085588 · Granted Sep 10, 2024

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Probe head for reduced-pitch applications2024
Vertical probe head having an improved contact with a device under test2024
Buckling beam probe arrays and methods for making such arrays including forming 2023
Probe card for high-frequency applications2021
Probe card for high-frequency applications2021
Probe card for electronics devices2020
Testing head of electronic devices2017
Contact probe for a testing head having vertical probes for semiconductor integr2007
Testing head contact probe with an eccentric contact tip2007
Testing head having vertical probes for semiconductor integrated electronic devi2004
Testing head having cantilever probes2004
Microstructure testing head2003