Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for testing memory by built-in self-test storage space and related device

Method for testing memory by built-in self-test storage space and related device

US Patent 12045150 · Granted Jul 23, 2024

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Curable silicone pressure sensitive adhesive emulsion and method for its prepara2025
Combined global and local process variation modeling2025
Semiconductor structure and method for manufacturing same2025
Systems and methods for continuous data protection comprising storage of complet2025
Method for manufacturing implantable micro-biosensor2025
Semiconductor structure and fabrication method thereof, and memory2025
Method and apparatus for indicating fault status2025
Semiconductor structure and method for manufacturing same2025
In-place data recovery2025
Snapshot-based virtual machine transfer across hypervisors2025
In-memory computing circuit and method, and semiconductor memory2025
Optical material and method for modifying the refractive index2025