Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making

Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making

US Patent 11973301 · Granted Apr 30, 2024

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Micro heat transfer arrays, micro cold plates, and thermal management systems fo2025
Methods of forming parts using laser machining2024
Multi-beam vertical probes with independent arms formed of a high conductivity m2024
Vertical probe arrays and improved methods for making using temporary or permane2023
Buckling beam probe arrays and methods for making such arrays including forming 2023
Fuel injector systems, fuel injectors, fuel injector nozzles, and methods for ma2021
Miniature shredding tools for use in medical applications, methods for making, a2021
Electrochemical fabrication methods incorporating dielectric materials and/or us2020
Stacking and bonding methods for forming multi-layer, three-dimensional, millime2018
Miniature shredding tool for use in medical applications and methods for making2018
Methods of forming parts using laser machining2018
Method and apparatus for maintaining parallelism of layers and/or achieving desi2017