Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Dummy dual in-line memory module (DIMM) testing system based on boundary scan interconnect and method thereof

Dummy dual in-line memory module (DIMM) testing system based on boundary scan interconnect and method thereof

US Patent 11965931 · Granted Apr 23, 2024

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Self-functional detection system for tap controller and method thereof2025
Self-functional detection system for tap controller and method thereof2025
Defect monitoring apparatus and detection method for transformer oil conservator2025
Multi-scale method for high-temperature structure ablation prediction of hyperso2025
Distance detection device2025
Open-circuit fault detection method and apparatus, and computer device2024
Display substrate having electrochromic structure with changeable transmittance,2024
Illumination module with annular circuit board and magnetic supports2024
Fault diagnosis method for three-phase power grid, apparatus, and computer devic2024
Display panel, method for manufacturing the same and display device2024
DIMM slot test system without series connection of test board through JTAG and m2024
DDR5 SDRAM DIMM slot detection system and method thereof2023