Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › GIS-based method for producing spatial wafer map, and method for providing wafer test results using same

GIS-based method for producing spatial wafer map, and method for providing wafer test results using same

US Patent 11894278 · Granted Feb 6, 2024

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Automatic switching communication method and automatic switching communication d2025
Building-attachable moving system and method of a mobility2025
Method of manufacturing a solid electrolyte for an all-solid-state battery throu2025
Docking system for vehicle and building and control method therefor2025
Vehicle body for vehicle2025
Method of manufacturing composite electrode for all-solid-state battery, and com2025
Lumbar retractor2025
Vehicle-building docking system and method of controlling the same2025
Sample holder for X-ray diffraction analysis and x-ray diffraction analysis meth2025
Luggage loading device for mobility and luggage loading method for mobility usin2025
Vehicle body2025
Flexible surface wave generator applicable to curved surfaces, and system and me2025