Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Acoustics-based noninvasive wafer defect detection

Acoustics-based noninvasive wafer defect detection

US Patent 11879868 · Granted Jan 23, 2024

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Fermentation product monitoring systems and associated methods2025
Piezoelectric and acoustic quick response codes2025
Needle dislodgement detection systems and methods2025
Simple bessel-like collimated sound beam generator2025
Simple bessel-like collimated sound beam generator2025
System and method for detecting venous needle dislodgement2025
High efficiency active environmental sampling of chemical traces2025
Destruction of airborne pathogens, and microorganisms on grains and dried food u2024
Detection of structural variations in articles using acoustic resonance spectros2024
High efficiency active environmental sampling of chemical traces2024
Hybrid acoustic, centrifugal oil/water separation2023
Multimodal characterization of a fluid using a single droplet2023