Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpiece

Diffraction device and method for non-destructive testing of internal crystal orientation uniformity of workpiece

US Patent 11846595 · Granted Dec 19, 2023

Assignee

No assignee recorded.

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Detection method, surface density device, detection means, and storage medium2025
Electric energy safety authentication apparatus2025
Device and method for measuring short-wavelength characteristic X-ray diffractio2024
Device and method for measuring short-wavelength characteristic X-ray diffractio2024
Device and method for measuring short-wavelength characteristic X-ray diffractio2024
Device and method for measuring short-wavelength characteristic X-ray diffractio2024
Device and method for measuring short-wavelength characteristic X-ray diffractio2024
Device and method for measuring short-wavelength characteristic X-ray diffractio2024
Point clouds registration system for autonomous vehicles2023
Merchant evaluation method and system2023
Real-time map generation system for autonomous vehicles2022
Map partition system for autonomous vehicles2022