Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Pattern measurement device and computer program

Pattern measurement device and computer program

US Patent 11802763 · Granted Oct 31, 2023

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Measurement method, measurement system, and non-transitory computer readable med2025
Optical inspection circuit and optical inspection method2025
System for estimating the occurrence of defects, and computer-readable medium2024
Optical circuit for alignment and optical alignment method2024
Aligning optical circuit and aligning method2024
Inspection device and method2024
Authentication device, authentication system, authentication method, and program2024
Mount, authentication device, authentication method, and program2024
Optical circuit for alignment2024
Optical test circuit2023
System for estimating the occurrence of defects, and computer-readable medium2023
Mount, authentication device, authentication method, and program2023