Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Atomic-force microscopy for identification of surfaces

Atomic-force microscopy for identification of surfaces

US Patent 11796564 · Granted Oct 24, 2023

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Atomic-force microscopy for identification of surfaces2024
Atomic-force microscopy for identification of surfaces2024
Functionalized nanoparticles having encapsulated guest cargo and methods for mak2023
Atomic-force microscopy for identification of surfaces2022
Atomic-force microscopy for identification of surfaces2022
Electrostatic speaker and a method for generating acoustic signals2021
Feedback correction in sub-resonant tapping mode of an atomic force microscope2021
Synthesis of mesoporous silica shapes using sodium silicate as a silica source2019
Tagging of materials and goods with particles of complex shapes and/or fluoresce2019
Method for analyzing biological specimens by spectral imaging2018
Phase correction to compensate for reflective distortions of optical spectra2018
Use of self-assembled nanoporous glass colloids for prolongation of plasticity o2017