Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Multi-tier threshold voltage offset bin calibration

Multi-tier threshold voltage offset bin calibration

US Patent 11783901 · Granted Oct 10, 2023

Estimated economic value: $11,017,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Program refresh with gate-induced drain leakage2025
Mitigating slow read disturb in a memory sub-system2025
Buffer allocation for reducing block transit penalty2025
Iterative bit flip decoding utilizing different bit flip states2025
Error decoding with soft redundant array of independent NAND (RAIN)2025
Multiple-pass programming of memory cells using temporary parity generation2025
Temporary parity buffer allocation for zones in a parity group2025
Generating semi-soft bit data during corrective read operations in memory device2025
Volatile data storage in NAND memory2025
Data age and validity-based memory management2025
Using a common pool of blocks for user data and a system data structure2025
Padding cached data with valid data for memory flush commands2025