Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Micro-electromechanical system (MEMS) interferometer for FT-MIR spectroscopy

Micro-electromechanical system (MEMS) interferometer for FT-MIR spectroscopy

US Patent 11774289 · Granted Oct 3, 2023

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Fast admittance measurement method for piezoelectric leaf cell sensor array in m2025
Attenuated total internal reflection optical sensor for obtaining downhole fluid2025
Suppressing vibration during wellbore drilling2024
Miniature FT-MIR using a MEMS interferometer with a metasurface emitter and dete2024
Attenuated total internal reflection optical sensor for obtaining downhole fluid2023
Miniature FT-MIR using a MEMS interferometer with a metasurface emitter and dete2023
Leaf cell sensor2022
Systems and methods for obtaining downhole fluid properties2022
Electromagnetic metamaterial cells, detectors comprising the same, and methods o2022
Dark acoustic metamaterial cell for hyperabsorption2022
Systems and method for analyzing downhole fluid properties using co-located mult2021
Method of estimating multi-phase fluid properties in a wellbore utilizing acoust2019