Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Noise parameter determination of scalable devices

Noise parameter determination of scalable devices

US Patent 11747384 · Granted Sep 5, 2023

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Frequency tunable balun2018
Noise temperature extraction procedure for characterization of on-wafer devices2016