Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Refining defect detection using process window

Refining defect detection using process window

US Patent 11728192 · Granted Aug 15, 2023

Estimated economic value: $84,686,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Electrical fuse formation during a multiple patterning process2022
Electrical fuse formation during a multiple patterning process2020
Semiconductor device structure and method for fabricating the same2019
MOSFET and method for manufacturing the same2018
Semiconductor devices and methods for manufacturing the same2018
Method of manufacturing fin field effect transistor2017
Quasi-nanowire transistor and method of manufacturing the same2017
Semiconductor device structure and method for fabricating the same2017
Method of manufacturing MOSFET2017
Semiconductor structure and method for manufacturing the same2017
MOSFET structure and manufacturing method thereof2017
Asymmetrical FinFET structure and method of manufacturing same2017