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Home › Method for self-calibrating tDQSCK that is skew between rising edge of memory clock signal and rising edge of DQS signal during read operation and associated signal processing circuit

Method for self-calibrating tDQSCK that is skew between rising edge of memory clock signal and rising edge of DQS signal during read operation and associated signal processing circuit

US Patent 11727968 · Granted Aug 15, 2023

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