Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Pulsed high current technique for characterization of device under test

Pulsed high current technique for characterization of device under test

US Patent 11705894 · Granted Jul 18, 2023

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Unified measurement system for static and dynamic characterization of a device u2025
Safety container for high power device testing over a range of temperatures2024
Interconnect system with high current and low leakage capability2024
High performance current source power supply2020
Automatic device detection and connection verification2020
Dynamically configurable remote instrument interface2020
Low frequency impedance measurement with source measure units2020
Rejection of mechanical vibration induced noise in electrical measurements2020
Triaxial DC-AC connection system2018
Low frequency impedance measurement with source measure units2017
Dynamic current limit apparatus and method2017
Hot switch protection circuit2017