Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Cryogenic wafer test system

Cryogenic wafer test system

US Patent 11693047 · Granted Jul 4, 2023

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Planar ring radiation barrier for cryogenic wafer test system2023
Planar ring radiation barrier for cryogenic wafer test system2023
Planar ring radiation barrier for cryogenic wafer test system2023
Superconducting flexible interconnecting cable connector2022
Support structure for a flexible interconnect of a superconductor2021
Forced flow cooling temperature control method, system, and apparatus2020
Temperature control method, system, and apparatus2020
Immersion cooling temperature control method, system, and apparatus2019
Cryogenic computing system with thermal management using a metal preform2019
Circuit card rack system and method2019
Computing system with superconducting and non-superconducting components located2018
Device and method for providing immersion cooling in a compact-format circuit ca2018