Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method of manufacturing an integrated circuit involving performing an electrostatic discharge test and electrostatic discharge test system performing the same

Method of manufacturing an integrated circuit involving performing an electrostatic discharge test and electrostatic discharge test system performing the same

US Patent 11650237 · Granted May 16, 2023

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor package including uneven structures and electronic device includin2025
Semiconductor package including uneven structures and electronic device includin2025
Semiconductor package including uneven structures and electronic device includin2025
Electronic device including thermal interface material layer and semiconductor p2025
Electronic device including thermal interface material layer and semiconductor p2025
Integrated circuit having current detection device and operating method thereof2025
Electronic device including housing and manufacturing method thereof2024
Electronic device including structure that reduces vibration in camera module2024
Semiconductor device2024
Semiconductor device2024
Electronic device including housing containing metallic materials2021
Apparatus and method for measuring positions of devices2020