Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Stacked memory device and test method thereof

Stacked memory device and test method thereof

US Patent 11646097 · Granted May 9, 2023

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Semiconductor system2025
Composition comprising O-cyclic phytosphingosine-1-phosphate for preventing or t2025
Memory system related to clock synchronization2025
Semiconductor devices and semiconductor systems related to synchronization betwe2025
Semiconductor devices and semiconductor systems calibrating termination resistan2025
Composition for surface treatment of Mg-containing galvanized steel sheet and Mg2025
Semiconductor devices2025
Semiconductor device related to calibrating termination resistance2025
Semiconductor device related to calibrating a termination resistance2025
Thermal conductive and electrically insulating paint composition, and exterior s2024
Probe for testing a semiconductor device and a probe card including the same2024
Multi-layer selector device and method of fabricating the same2024