Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Probe card for efficient screening of highly-scaled monolithic semiconductor devices

Probe card for efficient screening of highly-scaled monolithic semiconductor devices

US Patent 11579182 · Granted Feb 14, 2023

Estimated economic value: $167,621,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Detection of force applied by pick-up tool for transferring semiconductor device2023
Dielectric-dielectric and metallization bonding via plasma activation and laser-2023
Dielectric-dielectric and metallization bonding via plasma activation and laser-2023
Application of underfill via centrifugal force2023
Application of underfill via centrifugal force2023
Application of underfill via centrifugal force2023
Bridge pick-up head for transferring semiconductor devices2023
Probe card for characterizing processes of submicron semiconductor device fabric2023
Employing deformable contacts and pre-applied underfill for bonding LED devices 2023
Employing deformable contacts and pre-applied underfill for bonding LED devices 2023
Curing pre-applied and plasma-etched underfill via a laser2023
Curing pre-applied and plasma-etched underfill via a laser2023