Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Pattern inspection apparatus and pattern outline position acquisition method

Pattern inspection apparatus and pattern outline position acquisition method

US Patent 11569057 · Granted Jan 31, 2023

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Core/shell type polymer microparticles, dispersion of particles, and method for 2025
Method for searching for hole pattern in image, pattern inspection method, patte2025
Core-shell-type polymer fine particles having phosphonic acid or phosphonic acid2025
Method for producing vinyl ether polymer containing hydrocarbon group by radical2024
Pattern inspection apparatus and pattern inspection method2022
Method for producing vinyl ether polymer containing oxyethylene chain by radical2022
Multiple electron beam irradiation apparatus, multiple electron beam inspection 2021
Method of producing lipid2020
Method of producing lipid2020
Method for producing vinyl ether polymer having hydroxyl group on side chain and2020
Method for producing hydroxyl group-containing vinyl ether polymer2020
Alkenyl ether-vinyl ester copolymer2020