Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Measuring error in signal under test (SUT) using multiple channel measurement device

Measuring error in signal under test (SUT) using multiple channel measurement device

US Patent 11536761 · Granted Dec 27, 2022

Estimated economic value: $66,013,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Measuring error in signal under test (SUT) using multiple channel measurement de2023
System and method for reducing error in time domain waveform of a signal under t2023
Measuring error in signal under test (SUT) using multiple channel measurement de2022
System and method of analyzing crosstalk induced jitter2019
Jitter analysis systems and methods2018
System and method of analyzing crosstalk and intersymbol interference for serial2018
System and method of analyzing crosstalk without measuring aggressor signal2017
Method and apparatus for determining equalization coefficients2012
Method of finding data dependent timing and voltage jitter for different bits in2009
Method for equalizing a digital signal through removal of data dependent jitter2009
Method and apparatus using re-sampled tie records to characterize jitter in a di2008
Finding random jitter in an arbitrary non-repeating data signal2007