Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Defect detection in memory based on active monitoring of read operations

Defect detection in memory based on active monitoring of read operations

US Patent 11520657 · Granted Dec 6, 2022

Estimated economic value: $18,045,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Touch display computing device with radio frequency touch and gesture recognitio2025
Antenna assembly for integrated circuit package2025
Efficient periodic backend refresh reads for reducing bit error rate in memory d2025
Apparatus with multi-deck read level management and methods for operating the sa2025
Partial block handling protocol in a non-volatile memory device2025
Dynamic read calibration2025
Generating virtual blocks using partial good blocks2025
Adaptive sensing time for memory operations2025
Dynamic erase operation selection using erase policy2025
Single-level cell programming with adaptive wordline ramp rate2025
Adaptive integrity scan in a memory sub-system2025
Modification of program voltage level with read or program-verify adjustment for2025