Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Method for detecting abnormity in unsupervised industrial system based on deep transfer learning

Method for detecting abnormity in unsupervised industrial system based on deep transfer learning

US Patent 11507049 · Granted Nov 22, 2022

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Method for training model in virtual environment, medium, and electronic device2025
Double-entry leaf suction machine2025
Riding-type electric transfer tricycle2025
Voice conversion method, model training method, device, medium, and program prod2025
Method for automatically generating interactive test cases2025
Message generation based on multichannel context2025
Photosensitive circuit structure and optical device2025
Display panels and display devices2025
Generation of navigational route networks2025
Method for fusing map data, and electronic device2025
Diagnostic kit for metastasis and invasion of breast cancer and use of shRNA mol2025
Display substrate, display panel and display device2025